Successful detection of Out-of-Distribution (OoD) data is becoming increasingly important to ensure safe deployment of neural networks. One of the main challenges in OoD detection is that neural networks output overconfident predictions on OoD data, make it difficult to determine OoD-ness of data solely based on their predictions. Outlier exposure addresses this issue by introducing an additional loss that encourages low-confidence predictions on OoD data during training. While outlier exposure has shown promising potential in improving OoD detection performance, all previous studies on outlier exposure have been limited to utilizing visual outliers.

Handling out-of-distribution (OOD) samples has become a major stake in the real-world deployment of machine learning systems. This work explores the use of self-supervised contrastive learning to the simultaneous detection of two types of OOD samples: unseen classes and adversarial perturbations.